Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
Recent advances in focused ion beam technology and applications
Recent advances in focused ion beam technology and applications
Kleindiek Nanotechnik: In-situ lift-out
A Focused Ion Beam-Scanning Transmission Electron Microscopy with
Kleindiek Nanotechnik: In-situ lift-out
Easylift in-situ lift-out workflow
FIB thinning ‒ CIME ‐ EPFL
Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL
Focused ion beam - Wikipedia
Focused Ion Beams (FIB) — Novel Methodologies and Recent