Figure 1 from Effect of Under Bump Metallization (UBM) Quality on Long Term Reliability

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Process and Key Technology of Typical Advanced Packaging

Effect of Under Bump Metallization (UBM) Quality on Long Term

Schematic diagram of the electromigration test sample.

Solder Joint Characterization

Cu/Ni interface study for bump reliability improvement

Effect of Under Bump Metallization (UBM) Quality on Long Term

Solder Joint Technology

Simulation of current distribution in the solder bump: ͑ a ͒ Solder

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Micromachines, Free Full-Text

PDF) Preparation and Temperature Cycling Reliability of

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