Process and Key Technology of Typical Advanced Packaging
Effect of Under Bump Metallization (UBM) Quality on Long Term
Schematic diagram of the electromigration test sample.
Solder Joint Characterization
Cu/Ni interface study for bump reliability improvement
Effect of Under Bump Metallization (UBM) Quality on Long Term
Solder Joint Technology
Simulation of current distribution in the solder bump: ͑ a ͒ Solder
Coatings, Free Full-Text
Micromachines, Free Full-Text
PDF) Preparation and Temperature Cycling Reliability of